Enhancing the Swanepoel method: precise envelope detection of thin-film transmission spectra

The Swanepoel method is a widely used optical technique for characterizing thin films through normal-incidence transmission measurements. A critical step in this approach involves extracting the upper and lower envelopes of the measured oscillatory spectrum. By analyzing the transmission spectrum and its corresponding envelopes, the Swanepoel procedure enables precise determination of the film refractive index and extinction coefficient. However, even minor inaccuracies in envelope construction can propagate significant errors into the final characterization results. To address this challenge, we present what we believe to be a novel physics-informed optimization algorithm for envelope detection. Our mathematical model reformulates the envelope detection problem as a global optimization task that enforces the physical properties of the Swanepoel envelopes. Extensive validation on fifty randomly generated transmission spectra demonstrates unprecedented accuracy: the method achieves root-mean-square errors (RMSE) below 0.10% for the upper envelope and 0.06% for the lower envelope (more than doubling the accuracy of current state-of-the-art approaches). Furthermore, the proposed model has been assessed with two experimental transmission spectra, demonstrating its robustness and accuracy with real noisy data. We have developed an open-source Python software package (see text below). This software includes not only our innovative envelope construction algorithm but also additional envelope drawing algorithms for comparison and an efficient implementation of the Swanepoel method, enabling complete optical characterization of thin films.

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Publication Details

Journal
Optics Express
Published
2025-02-21
DOI
https://doi.org/10.1364/oe.553824
Citations
4
Primary Topic
Thin-Film Transistor Technologies
Type
article
Field-Weighted Citation Impact
2.92
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article

Enhancing the Swanepoel method: precise envelope detection of thin-film transmission spectra

Manuel Ballester, S. Fernández, Almudena P. Márquez, Santiago López-Tapia et al.
4 citations
Optics Express
Thin-Film Transistor Technologies
2.92
article

Enhancing the Swanepoel method: precise envelope detection of thin-film transmission spectra

Manuel Ballester, S. Fernández, Almudena P. Márquez, Santiago López-Tapia, Dorian Minkov, Aggelos K. Katsaggelos, Florian Willomitzer, Christoph Wuersch, E. Márquez, John Bass
article en
4 citations

Abstract

The Swanepoel method is a widely used optical technique for characterizing thin films through normal-incidence transmission measurements. A critical step in this approach involves extracting the upper and lower envelopes of the measured oscillatory spectrum. By analyzing the transmission spectrum and its corresponding envelopes, the Swanepoel procedure enables precise determination of the film refractive index and extinction coefficient. However, even minor inaccuracies in envelope construction can propagate significant errors into the final characterization results. To address this challenge, we present what we believe to be a novel physics-informed optimization algorithm for envelope detection. Our mathematical model reformulates the envelope detection problem as a global optimization task that enforces the physical properties of the Swanepoel envelopes. Extensive validation on fifty randomly generated transmission spectra demonstrates unprecedented accuracy: the method achieves root-mean-square errors (RMSE) below 0.10% for the upper envelope and 0.06% for the lower envelope (more than doubling the accuracy of current state-of-the-art approaches). Furthermore, the proposed model has been assessed with two experimental transmission spectra, demonstrating its robustness and accuracy with real noisy data. We have developed an open-source Python software package (see text below). This software includes not only our innovative envelope construction algorithm but also additional envelope drawing algorithms for comparison and an efficient implementation of the Swanepoel method, enabling complete optical characterization of thin films.

Optics ExpressVol. 33(6)
University of Arizona (US), Universidad de Cádiz (ES), OST - Ostschweizer Fachhochschule (CH)
Openalex Percentile: Top 10%
Thin-Film Transistor Technologies
2.92
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