Impact of Gate/Drain Biases in FDSOI-Based Analog Synapse on Artificial Neural-Network Performance
In this work, a low-cost artificial intelligent analog synapse using commercial 28-nm fully depleted silicon-on-insulator (FDSOI) CMOS technology was applied in a computing-in-memory (CIM)-based neural network (NN) and co-optimized from the device level to the system level. Through read-and-write scheme optimization, the synapse realized the nonlinearity of 0.14/0.90 and the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${I}_{\text {Pot}.}$ </tex-math></inline-formula>/<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${I}_{\text {Dep}.}$ </tex-math></inline-formula> ratio of 4.3:1, as well as excellent retention and uniformity. The comprehensive performance of the CIM-based NN system, including accuracy, energy, and latency, was evaluated by the open-source simulation tool NeuroSim+. Based on the device and system co-optimization, the CIM-based NN system can achieve an accuracy of 92% and energy consumption of only 0.45 mJ during online training. This work revealed the feasibility of the FDSOI FET-based synapse as a high performance and low cost solution for the CIM-based NN system.
Authors
- Xiao Yu (ORCID: https://orcid.org/0000-0001-8769-521X)
- S. Loubriat
- Ran Cheng (ORCID: https://orcid.org/0000-0001-6143-7714)
- Jiabao Ye (ORCID: https://orcid.org/0009-0009-3406-6714)
- Shun Xu
- Genquan Han (ORCID: https://orcid.org/0000-0001-5140-4150)
- Christophe Maleville
- F. Arnaud (ORCID: https://orcid.org/0000-0002-8426-6695)
- Wannian Wang
- Dong Liu (ORCID: https://orcid.org/0009-0004-1449-6139)
- Yan Liu (ORCID: https://orcid.org/0000-0001-5583-0587)
- Bing Chen (ORCID: https://orcid.org/0000-0001-5284-8618)
- Jiayi Zhao (ORCID: https://orcid.org/0009-0007-0682-8676)
- O. Weber
- Junru Qu
- G. Besnard
Institutions
- Soitec (France) (FR)
- Xidian University (CN)
- Zhejiang University of Science and Technology (CN)
- Zhejiang Technical Institute of Economics (CN)
- STMicroelectronics (France) (FR)
- Hangzhou Wanxiang Polytechnic (CN)
- Zhejiang University (CN)
Publication Details
- Journal
- IEEE Transactions on Electron Devices
- Published
- 2025-02-20
- DOI
- https://doi.org/10.1109/ted.2025.3540764
- Citations
- 2
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 1.46
Funders
- National Natural Science Foundation of China
- Natural Science Foundation of Zhejiang Province