Intelligent Inspection of Electronic Devices in Specific Environments via a Novel Cascade Network of Combining Mixed Sampling and Nonstrided Convolution

In environments where intelligent video surveillance systems (IVSSs) are deployed, particularly in review room, the detection of electronic devices constitutes a crucial task. Nevertheless, this task presents significant challenges attributed to the high rates of false positives and false negatives in electronic device detection (EDD), compounded by the low resolution of objects when viewed from multiple angles.To address these challenges, we propose a deep learning-based cascaded detection framework. Specifically, we design a mixed region sampling (MRS) method to enhance the foreground perception with background information and image details. We design a nonstrided downsampling method (ASDP) to map the attention spatial features to depth and improve the detection of low-resolution objects with fine-grained features. We enhance the model’s robustness to different viewing angles by feature perturbation during training. Moreover, we use a cascaded strategy to reduce false positives. To evaluate our method, we construct a real review room dataset (EDD) with 28,000 images from multiple angles. Our method improves the multiview generalization performance by 4.48% mAP and 5.62% mAR. On the public datasets Pascal VOC-2007 and visDrone-2019, our method is also superior to other suboptimal methods. We propose a framework for review environment detection, which is accurate, fast, and generalizable to other scenarios.

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Publication Details

Journal
IEEE Transactions on Systems Man and Cybernetics Systems
Published
2025-02-20
DOI
https://doi.org/10.1109/tsmc.2025.3539699
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
0.00

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article

Intelligent Inspection of Electronic Devices in Specific Environments via a Novel Cascade Network of Combining Mixed Sampling and Nonstrided Convolution

Jing Guo, Fengtao Nan, Chengrong Yang, Yaowei Wang et al.
IEEE Transactions on Systems Man and Cybernetics Systems
Industrial Vision Systems and Defect Detection
article

Intelligent Inspection of Electronic Devices in Specific Environments via a Novel Cascade Network of Combining Mixed Sampling and Nonstrided Convolution

Jing Guo, Fengtao Nan, Chengrong Yang, Yaowei Wang, Yun Yang, Bo Liu
article en

Abstract

In environments where intelligent video surveillance systems (IVSSs) are deployed, particularly in review room, the detection of electronic devices constitutes a crucial task. Nevertheless, this task presents significant challenges attributed to the high rates of false positives and false negatives in electronic device detection (EDD), compounded by the low resolution of objects when viewed from multiple angles.To address these challenges, we propose a deep learning-based cascaded detection framework. Specifically, we design a mixed region sampling (MRS) method to enhance the foreground perception with background information and image details. We design a nonstrided downsampling method (ASDP) to map the attention spatial features to depth and improve the detection of low-resolution objects with fine-grained features. We enhance the model’s robustness to different viewing angles by feature perturbation during training. Moreover, we use a cascaded strategy to reduce false positives. To evaluate our method, we construct a real review room dataset (EDD) with 28,000 images from multiple angles. Our method improves the multiview generalization performance by 4.48% mAP and 5.62% mAR. On the public datasets Pascal VOC-2007 and visDrone-2019, our method is also superior to other suboptimal methods. We propose a framework for review environment detection, which is accurate, fast, and generalizable to other scenarios.

IEEE Transactions on Systems Man and Cybernetics SystemsVol. 55(5)
Yunnan University (CN)
National Natural Science Foundation of China, Foundation for Fundamental Research of China
Openalex Percentile: Top 97%
Industrial Vision Systems and Defect Detection
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