Electron spectroscopy study of single-crystal CrTe

We study characterized single crystals of CrTe using photoemission spectroscopy (PES), x-ray absorption spectroscopy (XAS), and x-ray magnetic circular dichroism (XMCD) combined with density functional theory--based electronic structure calculations. X-ray diffraction confirms the hexagonal structure of CrTe ($P63/mmc$ space group) and $T$-dependent magnetization $M(T)$ shows a Curie temperature ${T}_{C}=340\phantom{\rule{0.28em}{0ex}}\mathrm{K}$, with a three-dimensional Ising-type critical behavior. A quantitative analysis of $\mathrm{Cr}\phantom{\rule{0.28em}{0ex}}3p$ and $\mathrm{Te}\phantom{\rule{0.28em}{0ex}}4d$ core levels using hard x-ray PES (HAXPES; $h\ensuremath{\nu}=6.5\phantom{\rule{0.28em}{0ex}}\mathrm{keV}$) and low-energy PES $(h\ensuremath{\nu}=100\phantom{\rule{0.28em}{0ex}}\mathrm{eV})$ indicates a nearly stoichiometric composition of ${\mathrm{Cr}}_{0.99\ifmmode\pm\else\textpm\fi{}0.01}\mathrm{Te}$. HAXPES of $\mathrm{Te}\phantom{\rule{0.28em}{0ex}}3p$ and $3d$ core levels show clean asymmetric single peaks with plasmon satellites. The $\mathrm{Cr}\phantom{\rule{0.28em}{0ex}}2p$ spectrum lies close to the $\mathrm{Te}\phantom{\rule{0.28em}{0ex}}3d$ spectrum but could be separated out and shows weak charge-transfer satellites. The Cr $L$-edge XAS-XMCD and $\mathrm{Cr}\phantom{\rule{0.28em}{0ex}}2p$ PES spectra could be simulated using charge transfer multiplet cluster-model calculations for a ${\mathrm{Cr}}^{2+}$ configuration with on-site Coulomb energy ${U}_{dd}=3.5\phantom{\rule{0.28em}{0ex}}\mathrm{eV}$ and a negative charge-transfer energy $\mathrm{\ensuremath{\Delta}}=\ensuremath{-}1\phantom{\rule{0.28em}{0ex}}\mathrm{eV}$. A sum-rule analysis of XAS-XMCD spectra indicates a very small orbital magnetic moment ${m}_{o}=0.01\ifmmode\pm\else\textpm\fi{}0.01\phantom{\rule{0.28em}{0ex}}{\ensuremath{\mu}}_{B}$ and a spin magnetic moment ${m}_{s}=2.49\ifmmode\pm\else\textpm\fi{}0.2\phantom{\rule{0.28em}{0ex}}{\ensuremath{\mu}}_{B}$ at $T=25\phantom{\rule{0.28em}{0ex}}\mathrm{K}$, consistent with magnetization measurements and cluster-model calculations. Comparison of the calculated density of states (DOS) with the HAXPES valence band spectrum shows that the $\mathrm{Te}\phantom{\rule{0.28em}{0ex}}5p$ states dominates the spectrum due to the large photoionization cross section of Te $5p$ states with hard x rays. The Cr $3d$ partial DOS are spread between the Fermi level $({E}_{F}$) to $\ensuremath{\sim}5\text{\ensuremath{-}}\mathrm{eV}$ binding energy (BE), while the $\mathrm{Te}\phantom{\rule{0.28em}{0ex}}5p$ partial DOS are spread between the ${E}_{F}$ and $\ensuremath{\sim}7\text{\ensuremath{-}}\mathrm{eV}$ BE. The obtained electronic parameters suggest that CrTe is a $p$-type metal in the Zaanen-Sawatzky-Allen phase diagram, with $p\ensuremath{\rightarrow}p$-type lowest-energy excitations.

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Publication Details

Journal
Physical review. B./Physical review. B
Published
2025-02-20
DOI
https://doi.org/10.1103/physrevb.111.085142
Citations
2
Primary Topic
Chalcogenide Semiconductor Thin Films
Type
article
Field-Weighted Citation Impact
1.46

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article

Electron spectroscopy study of single-crystal CrTe

Yu‐Xun Chen, A. Chainani, Nozomu Hiraoka, C. S. Lue et al.
2 citations
Physical review. B./Physical review. B
Chalcogenide Semiconductor Thin Films
1.46
article

Electron spectroscopy study of single-crystal CrTe

Yu‐Xun Chen, A. Chainani, Nozomu Hiraoka, C. S. Lue, Truc Ly Nguyen, C. T. Chen, Priya Mahadevan, H.‐J. Lin, Masato Yoshimura, Shishir Kumar Pandey, Atsushi Fujimori, Yi-Ting Cheng, F.-H. Chang, T.-W. Pi, A.R. Shelke, Chia-Nung Kuo
article en
2 citations

Abstract

We study characterized single crystals of CrTe using photoemission spectroscopy (PES), x-ray absorption spectroscopy (XAS), and x-ray magnetic circular dichroism (XMCD) combined with density functional theory--based electronic structure calculations. X-ray diffraction confirms the hexagonal structure of CrTe ($P63/mmc$ space group) and $T$-dependent magnetization $M(T)$ shows a Curie temperature ${T}_{C}=340\phantom{\rule{0.28em}{0ex}}\mathrm{K}$, with a three-dimensional Ising-type critical behavior. A quantitative analysis of $\mathrm{Cr}\phantom{\rule{0.28em}{0ex}}3p$ and $\mathrm{Te}\phantom{\rule{0.28em}{0ex}}4d$ core levels using hard x-ray PES (HAXPES; $h\ensuremath{\nu}=6.5\phantom{\rule{0.28em}{0ex}}\mathrm{keV}$) and low-energy PES $(h\ensuremath{\nu}=100\phantom{\rule{0.28em}{0ex}}\mathrm{eV})$ indicates a nearly stoichiometric composition of ${\mathrm{Cr}}_{0.99\ifmmode\pm\else\textpm\fi{}0.01}\mathrm{Te}$. HAXPES of $\mathrm{Te}\phantom{\rule{0.28em}{0ex}}3p$ and $3d$ core levels show clean asymmetric single peaks with plasmon satellites. The $\mathrm{Cr}\phantom{\rule{0.28em}{0ex}}2p$ spectrum lies close to the $\mathrm{Te}\phantom{\rule{0.28em}{0ex}}3d$ spectrum but could be separated out and shows weak charge-transfer satellites. The Cr $L$-edge XAS-XMCD and $\mathrm{Cr}\phantom{\rule{0.28em}{0ex}}2p$ PES spectra could be simulated using charge transfer multiplet cluster-model calculations for a ${\mathrm{Cr}}^{2+}$ configuration with on-site Coulomb energy ${U}_{dd}=3.5\phantom{\rule{0.28em}{0ex}}\mathrm{eV}$ and a negative charge-transfer energy $\mathrm{\ensuremath{\Delta}}=\ensuremath{-}1\phantom{\rule{0.28em}{0ex}}\mathrm{eV}$. A sum-rule analysis of XAS-XMCD spectra indicates a very small orbital magnetic moment ${m}_{o}=0.01\ifmmode\pm\else\textpm\fi{}0.01\phantom{\rule{0.28em}{0ex}}{\ensuremath{\mu}}_{B}$ and a spin magnetic moment ${m}_{s}=2.49\ifmmode\pm\else\textpm\fi{}0.2\phantom{\rule{0.28em}{0ex}}{\ensuremath{\mu}}_{B}$ at $T=25\phantom{\rule{0.28em}{0ex}}\mathrm{K}$, consistent with magnetization measurements and cluster-model calculations. Comparison of the calculated density of states (DOS) with the HAXPES valence band spectrum shows that the $\mathrm{Te}\phantom{\rule{0.28em}{0ex}}5p$ states dominates the spectrum due to the large photoionization cross section of Te $5p$ states with hard x rays. The Cr $3d$ partial DOS are spread between the Fermi level $({E}_{F}$) to $\ensuremath{\sim}5\text{\ensuremath{-}}\mathrm{eV}$ binding energy (BE), while the $\mathrm{Te}\phantom{\rule{0.28em}{0ex}}5p$ partial DOS are spread between the ${E}_{F}$ and $\ensuremath{\sim}7\text{\ensuremath{-}}\mathrm{eV}$ BE. The obtained electronic parameters suggest that CrTe is a $p$-type metal in the Zaanen-Sawatzky-Allen phase diagram, with $p\ensuremath{\rightarrow}p$-type lowest-energy excitations.

Physical review. B./Physical review. BVol. 111(8)
National Taiwan University (TW), National Tsing Hua University (TW), National Synchrotron Radiation Research Center (TW), National Science and Technology Council (ZM), Birla Institute of Technology and Science, Pilani (IN), The University of Tokyo (JP), Bose (United States) (US), National Cheng Kung University (TW)
Ministry of Education, Japan Society for the Promotion of Science
Openalex Percentile: Top 19%
Chalcogenide Semiconductor Thin Films
1.46
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