Electronic System Life Prediction Algorithm Based on the Physical of Failure

Enhancing the availability and safety of electronic systems necessitates a comprehensive investigation into their reliability. This study proposes an electronic system life prediction algorithm based on the physics of failure. For commonly used components, both failure physical models and degradation physical models are presented. An improved binary decision diagram (BDD) is constructed, accompanied by the development of a model-solving algorithm. Ultimately, the proposed methodology is applied to the driver circuit board of an electronic controller as a specific case study, thereby demonstrating its effectiveness and validity.