Manufacturing WSe<sub>2</sub> optoelectronic membrane-based devices using low-cost optical lithography

Two-dimensional transition metal dichalcogenides (TMDCs) such as tungsten diselenide (WSe<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>) exhibit exceptional optoelectronic properties that can be explored for sensing applications using simplified device architectures. In this study, we report a WSe<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>-based photodetector using minimally complex fabrication processes, including mechanical exfoliation of WSe<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> and manual mask alignment for photolithography. The device was characterized through electrical transport measurements under ambient and cryogenic conditions. Illumination-dependent analysis revealed a photocurrent enhancement factor of approximately 10 times when measured in vacuum compared to ambient conditions while at room temperature and equivalent photoexcitation conditions. Our findings through this study, validate the feasibility of fabricating WSe<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>-based devices, including photodetectors, using simplified fabrication methodologies, in contrast to complicated processes such as e-beam lithography. This approach offers potential for the development of cost-effective manufacturing approaches for optoelectronic devices based on two-dimensional materials.

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Published
2024-11-13
DOI
https://doi.org/10.1109/metrocon62511.2024.10883924
Primary Topic
Chalcogenide Semiconductor Thin Films
Type
article
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article

Manufacturing WSe2 optoelectronic membrane-based devices using low-cost optical lithography

Silvino P. Bastos, Anupama B. Kaul, Thomas Mather, Brittany O’Neal
Chalcogenide Semiconductor Thin Films
article

Manufacturing WSe2 optoelectronic membrane-based devices using low-cost optical lithography

Silvino P. Bastos, Anupama B. Kaul, Thomas Mather, Brittany O’Neal
article en

Abstract

Two-dimensional transition metal dichalcogenides (TMDCs) such as tungsten diselenide (WSe<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>) exhibit exceptional optoelectronic properties that can be explored for sensing applications using simplified device architectures. In this study, we report a WSe<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>-based photodetector using minimally complex fabrication processes, including mechanical exfoliation of WSe<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> and manual mask alignment for photolithography. The device was characterized through electrical transport measurements under ambient and cryogenic conditions. Illumination-dependent analysis revealed a photocurrent enhancement factor of approximately 10 times when measured in vacuum compared to ambient conditions while at room temperature and equivalent photoexcitation conditions. Our findings through this study, validate the feasibility of fabricating WSe<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>-based devices, including photodetectors, using simplified fabrication methodologies, in contrast to complicated processes such as e-beam lithography. This approach offers potential for the development of cost-effective manufacturing approaches for optoelectronic devices based on two-dimensional materials.

University of North Texas (US)
Air Force Office of Scientific Research
Affordable and clean energy
Openalex Percentile: Top 75%
Chalcogenide Semiconductor Thin Films
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