Aging-Aware Design Method for Reliable Analog Integrated Circuits Combining Reliability-Aware Circuit Architectures, Transistor's Threshold Voltage and Operating Point-Dependent Degradation

Assessing the reliability of analog and mixedsignal circuits is a crucial component of the integrated circuit (IC) verification process. This evaluation involves not only examining the circuits’ current performance but also predicting how their functionality might degrade over time due to aging effects. The process of reliability estimation encompasses a range of tests designed to simulate the long-term impacts of aging on the circuit's behavior, ensuring that the IC will continue to operate reliably throughout its expected lifecycle. Existing standard analog and mixed-signal blocks were analyzed by considering one or two methods of increasing circuits’ reliability. Therefore, analog standard blocks have been examined considering aging effects such as voltage threshold, and operating point-dependent degradation, by using MOSRA models. As operating point-dependent degradation has significant impact on analog block's aging, so it should be taken into account while designing aging-aware analog ICs.