Reliable All PMOS Voltage Doublers for Low-Voltage Applications

Limitations of traditional charge pump architectures are investigated, particularly in the context of low voltage operation and reliability challenges. To address these challenges, two all PMOS charge pumps are proposed, one with a four-phase clocking scheme and another with a six-phase clocking scheme. The proposed structures offer enhanced protection against voltage overstress and higher efficiency at low supply voltages. Both traditional and proposed pumps are designed in 14nm process using same sized pumping capacitors, equal clock frequency and output loading to fairly evaluate the efficiency and longevity of the different designs. Results demonstrate that the proposed designs can provide high pumping efficiency at low voltage processes without overstress.