A Lightweight Heterogeneous Graph Embedding Framework for Hotspot Detection

Hotspot detection is a crucial step in ensuring the manufacturability of integrated circuits, as it seeks to identify potential defects in the layout. Pattern matching methods have been widely used to accelerate the detection of these defects. However, they often struggle with complicated deviations. Image-based machine learning methods were introduced to confront this challenge, but they often involved distorted information extraction and incurred significant runtime overhead. In this article, we introduce a novel detection framework based on the modified transitive closure graph (MTCG). By applying the concept of MTCG, the layout can be accurately modeled as a heterograph. The embeddings of these heterographs are extracted using an optimized lightweight 3-hop message-passing graph neural network (GNN) and subsequently utilized for classification. Furthermore, a dynamic edge transformation method based on the properties of MTCG is proposed for data augmentation. The proposed method is evaluated with datasets from ICCAD 2012 and ICCAD 2019, demonstrating outstanding performance in recall and false alarm, along with a significantly decreased inference time.