Advanced Path Delay Fault Testing Strategies in High-Performance Digital Circuits

The presence of delay faults and addressing them in high-speed digital circuits is an important and challenging task in industries. Delay faults affect the performance of the circuits. To detect such delay defects and assure the timing accuracy of the circuit delay testing plays a critical role. In this paper, a brief of delay testing techniques with emphasis on path delay fault testing is reviewed. A review presented in this paper highlights significant delay test methodologies with the assumption of its greater impact in the future than it has now. We also used the path delay fault testing to detect the infected integrated circuits with improved fault coverage.