GaN-Based Low Noise Flat Gain Amplifier for X-Band Applications

This paper describes the design of a low noise amplifier (LNA) monolithic microwave integrated circuit based on GaN-on-SiC technology. The amplifier operates in the frequency range of 9.5 <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$-11.5\ \text{GHz}$</tex>. The design topology and careful choice of HEMTs ensure high gain and low output power at 1-dB compression point <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(\mathbf{P}_{1\text{dB}}). \mathbf{P}_{1\text{dB}}$</tex> and saturated output power <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(\mathbf{P}_{\mathbf{sat}})$</tex> have a direct relation with each other. The low <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathbf{P}_{\text{sat}}$</tex> feature is desired to safely integrate GaN LNAs with subsequent circuitry in the radar receiver systems. The proposed LNA consists of two stages, having 300 μm periphery at the first stage and 200 <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mu\mathbf{m}$</tex> periphery at the second stage. The low periphery device provides better gain, lower output power, and hence lower <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathbf{P}_{1}\text{dB}$</tex>. The amplifier provides a gain of 20.9 dB with +/- 0.2 dB gain ripple. Its input and output reflection coefficients are better than -9.6 dB and -11 dB, respectively. The overall chip size is 2.9 mm x 1.5 mm.

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Publication Details

Published
2024-08-20
DOI
https://doi.org/10.1109/ibcast61650.2024.10877008
Citations
2
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
0.62
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article

GaN-Based Low Noise Flat Gain Amplifier for X-Band Applications

Erdem Aras, Salahuddin Zafar, Ekmel Özbay, Büşra Çankaya Akoğlu et al.
2 citations
GaN-based semiconductor devices and materials
0.62
article

GaN-Based Low Noise Flat Gain Amplifier for X-Band Applications

Erdem Aras, Salahuddin Zafar, Ekmel Özbay, Büşra Çankaya Akoğlu, Muhammad Nawaz
article en
2 citations

Abstract

This paper describes the design of a low noise amplifier (LNA) monolithic microwave integrated circuit based on GaN-on-SiC technology. The amplifier operates in the frequency range of 9.5 <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$-11.5\ \text{GHz}$</tex>. The design topology and careful choice of HEMTs ensure high gain and low output power at 1-dB compression point <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(\mathbf{P}_{1\text{dB}}). \mathbf{P}_{1\text{dB}}$</tex> and saturated output power <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(\mathbf{P}_{\mathbf{sat}})$</tex> have a direct relation with each other. The low <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathbf{P}_{\text{sat}}$</tex> feature is desired to safely integrate GaN LNAs with subsequent circuitry in the radar receiver systems. The proposed LNA consists of two stages, having 300 μm periphery at the first stage and 200 <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mu\mathbf{m}$</tex> periphery at the second stage. The low periphery device provides better gain, lower output power, and hence lower <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathbf{P}_{1}\text{dB}$</tex>. The amplifier provides a gain of 20.9 dB with +/- 0.2 dB gain ripple. Its input and output reflection coefficients are better than -9.6 dB and -11 dB, respectively. The overall chip size is 2.9 mm x 1.5 mm.

Bilkent University (TR)
Affordable and clean energy
Openalex Percentile: Top 30%
GaN-based semiconductor devices and materials
0.62
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