Storage Reliability Prediction of a MEMS Gyroscope Based on Accelerated Degradation Test

The degradation mechanism of MEMS gyroscopes is complex, characterized by volatility and nonlinearity. Accurate storage reliability prediction for highly reliable and long-lifetime MEMS gyroscopes is challenging. This study predicts the storage reliability and lifespan of the sensor by conducting accelerated degradation tests on MEMS gyroscopes and utilizing performance degradation data. Firstly, a constant stress accelerated degradation test based on temperature stress was designed, and the failure data were obtained Then, the constraint relationship between the Wiener process drift parameter and diffusion parameter is derived from the test data. Combining with the Arrhenius model, the acceleration models of the drift parameter and diffusion parameter are derived. Thus, the storage reliability and reliable life of the MEMS gyroscopes under normal storage conditions are obtained.