Calculated Elastic Constants of CdS and CdTe Thin Films with Cubic and Hexagonal Crystal Structure for Stress Problems

Young's modulus (E) and Poisson's ratio (<tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$v$</tex>) are critical for the theoretical calculation and experimental determination of residual stresses that occur during the growth of semiconductor thin films. This paper introduces generalized expressions for E, v and <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$E/(1-v)$</tex>) for hexagonal and cubic structures common to cadmium sulphide and cadmium telluride semiconductors. These elastic constants are found to be invariant within the c-plane. Numerical values for these constants have been computed and tabulated for CdS and CdTe.