Ultra-low Loss Build-up Film Dielectric for Advanced Packaging

This paper introduces a novel low-loss film dielectric material and describes the performance of the material. As the demand for faster, smaller, and more energy-efficient electronic devices continues to surge, the IC substrates must have the capability of meeting the stringent requirements, especially to support high speed signal transmissions. As the signal frequencies increase, the importance of reducing dielectric loss is getting more critical in enhancing the performance of IC substrates. However, achieving ultra-low loss characteristics in build-up dielectric materials remains a formidable technical challenge, hindered by the inherent limitations of traditional epoxy-based materials. This paper introduces a novel build-up dielectric material that addresses the technical limitation of the conventional materials. Leveraging advanced material design and process technology, the new dielectric film material offers ultra-low electrical loss characteristics with robust reliability performance and standard manufacturing processes compatibility. The unique material design bestows extremely stable electrical performance at higher temperatures. Signal transmission measurement demonstrated that the new material exhibited approximately 40% lower transmission loss compared to the conventional material. The superior characteristics make the dielectric material ideal for advanced packaging in high performance computing, telecommunications, and evolving automotive applications.

Authors

Institutions

Publication Details

Journal
IMAPSource Proceedings
Published
2025-02-07
DOI
https://doi.org/10.4071/001c.129509
Primary Topic
Copper Interconnects and Reliability
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Ultra-low Loss Build-up Film Dielectric for Advanced Packaging

Kazuyoshi Yoneda, Yuya Suzuki, Kazutaka Nakada, Mami Nosaka
IMAPSource Proceedings
Copper Interconnects and Reliability
article

Ultra-low Loss Build-up Film Dielectric for Advanced Packaging

Kazuyoshi Yoneda, Yuya Suzuki, Kazutaka Nakada, Mami Nosaka
article en

Abstract

This paper introduces a novel low-loss film dielectric material and describes the performance of the material. As the demand for faster, smaller, and more energy-efficient electronic devices continues to surge, the IC substrates must have the capability of meeting the stringent requirements, especially to support high speed signal transmissions. As the signal frequencies increase, the importance of reducing dielectric loss is getting more critical in enhancing the performance of IC substrates. However, achieving ultra-low loss characteristics in build-up dielectric materials remains a formidable technical challenge, hindered by the inherent limitations of traditional epoxy-based materials. This paper introduces a novel build-up dielectric material that addresses the technical limitation of the conventional materials. Leveraging advanced material design and process technology, the new dielectric film material offers ultra-low electrical loss characteristics with robust reliability performance and standard manufacturing processes compatibility. The unique material design bestows extremely stable electrical performance at higher temperatures. Signal transmission measurement demonstrated that the new material exhibited approximately 40% lower transmission loss compared to the conventional material. The superior characteristics make the dielectric material ideal for advanced packaging in high performance computing, telecommunications, and evolving automotive applications.

IMAPSource ProceedingsVol. 2024(Symposium)
E Ink (South Korea) (KR), Taiyo Yuden (Japan) (JP)
Openalex Percentile: Top 98%
Copper Interconnects and Reliability
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Ultra-low Loss Build-up Film Dielectric for Advanced Packaging — Kazuyoshi Yoneda, Yuya Suzuki, et al. · IMAPSource Proceedings (2025) | TGRS Research Map | TGRS