Fan-Out Chip-Last Panel-Level Packaging for Heterogeneous Integration
In this study, the fan-out chip-last panel-level packaging in fabricating an ultra-large organic interposer of a hybrid substrate for heterogeneous integration is investigated. Emphasis is placed on the design, materials, process, fabrication, and reliability of a hybrid substrate (85 mm x 80 mm) with an ultra-large organic interposer (5 RDLs with the minimum metal line width (L) and spacing (S) = 2 μm) and a 5-2-5 build-up package substrate. Also, some recommendations are provided.
Authors
- John H. Lau (ORCID: https://orcid.org/0000-0003-1284-8829)
- Henry Yang
- Curry Lin
- Tian Xia (ORCID: https://orcid.org/0000-0002-4395-7350)
- Minglin Ma (ORCID: https://orcid.org/0000-0003-4599-8479)
- Bryant Lin (ORCID: https://orcid.org/0000-0002-7284-0522)
- Tzyy-Jang Tseng
- Christopher S. Chen (ORCID: https://orcid.org/0000-0003-2445-8449)
- C. T. Ko
Institutions
- Micron Corporation (United States) (US)
Publication Details
- Journal
- IMAPSource Proceedings
- Published
- 2025-02-10
- DOI
- https://doi.org/10.4071/001c.129610
- Primary Topic
- 3D IC and TSV technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00