Fabrication and Passive Assembly of Broadband Evanescent Couplers for Sustainable Pbps Co-Packaged Optics

A passively assembled chip-to-package substrate evanescent coupler between silicon nitride and silicon was experimentally demonstrated across the 1480-1640 nm wavelength regime with a 0.39 ± 1.06 dB coupling loss at 1550 nm, a 160 nm 1-dB wavelength tolerance (1480-1640 nm), and a 1-dB lateral alignment tolerance of ± 1.56 𝜇𝜇m. The thermal stability was evaluated from 23-60°C with average coupling loss and alignment tolerance varying by less than ± 0.35 dB and ± 30 nm, respectively. The repeatability of the packaging process flow was also evaluated by measuring coupler performance across four separately packaged systems, with a total range of 1.5 dB for coupling loss observed. Results show the viability of this coupler to help achieve Pbps co-packaged optics switch performance by eliminating active fiber-to-chip alignment and scaling down optical input/output pitch at the die level.

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Publication Details

Journal
IMAPSource Proceedings
Published
2025-02-13
DOI
https://doi.org/10.4071/001c.129746
Primary Topic
Semiconductor Lasers and Optical Devices
Type
article
Field-Weighted Citation Impact
0.00

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article

Fabrication and Passive Assembly of Broadband Evanescent Couplers for Sustainable Pbps Co-Packaged Optics

Samuel Serna, Luigi Ranno, Lionel C. Kimerling, Drew M. Weninger et al.
2 links
IMAPSource Proceedings
Semiconductor Lasers and Optical Devices
article

Fabrication and Passive Assembly of Broadband Evanescent Couplers for Sustainable Pbps Co-Packaged Optics

Samuel Serna, Luigi Ranno, Lionel C. Kimerling, Drew M. Weninger, Anu Agarwal
article en

Abstract

A passively assembled chip-to-package substrate evanescent coupler between silicon nitride and silicon was experimentally demonstrated across the 1480-1640 nm wavelength regime with a 0.39 ± 1.06 dB coupling loss at 1550 nm, a 160 nm 1-dB wavelength tolerance (1480-1640 nm), and a 1-dB lateral alignment tolerance of ± 1.56 𝜇𝜇m. The thermal stability was evaluated from 23-60°C with average coupling loss and alignment tolerance varying by less than ± 0.35 dB and ± 30 nm, respectively. The repeatability of the packaging process flow was also evaluated by measuring coupler performance across four separately packaged systems, with a total range of 1.5 dB for coupling loss observed. Results show the viability of this coupler to help achieve Pbps co-packaged optics switch performance by eliminating active fiber-to-chip alignment and scaling down optical input/output pitch at the die level.

IMAPSource ProceedingsVol. 2024(Symposium)
Bridgewater State University (US), Massachusetts Institute of Technology (US)
National Science Foundation
Openalex Percentile: Top 98%
Semiconductor Lasers and Optical Devices
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