2D Imaging of Graphene Oxide Electric Parameters with a 10 GHz Inverted Single-Post Dielectric Resonator

Accurate measurement of conductivity and sheet resistance is essential for evaluating conductive materials, such as graphene oxide papers. This study employs a 10 GHz inverted Single-Post Dielectric Resonator (iSiPDR) integrated into a 2D scanning system to detect shifts in resonant frequency and Q - factor for thin films and bulk materials. The experimental setup, controlled by a Scanner Unit Control Application and a Vector Network Analyzer, enables the generation of 2D maps of material properties to identify variations and defects. Data analysis involves retro-modeling with a Body-of-Revolution Finite-Difference Time-Domain (BoR FDTD) algorithm and advanced signal processing techniques, including automated Prony methods, to accurately extract material parameters. This method provides a robust modelling-based characterization framework for material characterization, supporting quality control and optimization in microelectronics and battery technologies.