Analysis of field uniformity in a TEM cell based on MoM and measured field strength
This paper analyzed the field uniformity of a transverse electromagnetic (TEM) cell with 3m in height by using the electric field data based on the method of moment (MoM) in static field approximation and the measured field strength. Considering the uncertainty of the instrument and the testing error of the field intensity probe, it can be concluded that theoretical calculation agrees with practical test to some extent.
Authors
- Mingjie Sheng (ORCID: https://orcid.org/0000-0002-3548-6798)
- Chengjie Li (ORCID: https://orcid.org/0009-0002-5707-3617)
- Zhongyuan Zhou (ORCID: https://orcid.org/0000-0002-8426-4876)
- Jinjing Ren (ORCID: https://orcid.org/0000-0002-3068-0030)
- Yixing Gu (ORCID: https://orcid.org/0000-0001-7061-759X)
- Qi Zhou (ORCID: https://orcid.org/0000-0001-6116-2036)
Institutions
- China North Industries Group Corporation (China) (CN)
- Southeast University (CN)
Publication Details
- Published
- 2024-12-21
- DOI
- https://doi.org/10.1109/apace62360.2024.10877363
- Primary Topic
- Semiconductor materials and interfaces
- Type
- article
- Field-Weighted Citation Impact
- 0.00