Computational Electromagnetic Measurements of Induced Voltage and Induced Current on Shielded and Unshielded Victim Cables due to Irradiation Intentional Electromagnetic Interferences

Problems related to EMC, EMI, and IEMI may sometimes due to the cables, as these cables could be either radiating through poor shields or producing coupling with other cables, devices, or antennas. This will cause voltage and current disturbances that could resulted a system malfunction. Hence, this work demonstrated the analysis for a better understanding of the induced voltages and induced currents in cables due to IEMI signals. Induced voltages and induced currents for shielded and unshielded victim cables were measured for E-field ranging from 0.1 V/m to 20 V/m at operating frequency of 2.45 GHz using FEKO, and employing MTL and MoM numerical solvers as comparison purposes. Rising E-field strengths resulted the increase of induced voltages and induced currents, which were found to be 354.802 mV and 0.723 mA at the maximum electric field exposure, respectively. This behaviour was similar when either MoM or MTL numerical solver was employed, for all E-field intensities, with induced voltage values to be 355.28 mV and 275.62 mV, respectively. This demonstrated that MoM results were in agreement to the normal computational model, while MTL results in induced voltage declined by 22%.