Study of Structural Properties of Cadmium Telluride Films Obtained on Different Substrates

Using modernized vacuum systems, it has been prepared a series of CdTe thin film samples by application of thermal vacuum evaporation method on three types of substrate material in order to investigate the varying of thin films structural parameters in dependence of material of substrate. The structural parameters were investigated by using the method of X-ray diffractometric analysis, based on which the lattice parameters, the sizes of the coherent scattering regions and the texture coefficient of the samples were obtained. According to the experimental study it was found that for samples obtained on dielectric substrate only the cubic phase of CdTe was spotted. In case of samples prepared on substrate with conductive layer it was spotted the two types of hexagonal phases and a presence a little quantity of cubic phase. Samples prepared on metal substrate contains practically only from the cubic phase of CdTe which can be connected with technological regimes of film samples obtaining. For this samples were spotted the value of lattice parameter which maximally close to the etalon value among all investigated samples which is also mainly connected with technological features, especially the speed of thin film growth.