Investigation of the Microstructures and Mechanical Properties of Sn-Cu-Bi-In-Ni Solders
The development of Ag-free Sn solders has attracted significant attention due to the requirement of high-density electronic packaging. In this study, we investigate the Ni element on the microstructures and mechanical properties of Ag-free Sn-Cu-Bi-In solders. This paper details the microstructures and phases of the as-prepared Sn-Cu-Bi-In-Ni solders, as well as its mechanical properties. Specifically, the intermetallic compound (IMC) Cu<sub>6</sub>Sn<sub>5</sub> is observed to be distributed in the Sn matrix, forming near-eutectic structures. The incorporation of Ni into Sn-Cu-Bi-In enhances the mechanical properties of the solder joints, including the shear strength and vibrational stability. In the joint obtained using the as-prepared Sn-Cu-Bi-In-Ni solders, a (Cu,Ni)<sub>6</sub>Sn<sub>5</sub> IMC layer forms at the interface between Sn ball and Cu pad. The beneficial effects of Ni can be primarily attributed to its ability to adjust the mechanical properties and thermal expansion, enhancing the stability of solder joints. A TEM analysis reveals the closely packed atomic interface of Cu/(Cu,Ni)<sub>6</sub>Sn<sub>5</sub> and (Cu,Ni)<sub>6</sub>Sn<sub>5</sub>/Sn, elucidating the joining mechanism involved.
Authors
- Xiaochun Lv
- Yang Liu (ORCID: https://orcid.org/0000-0002-4311-2198)
- Zhen Pan (ORCID: https://orcid.org/0000-0003-1118-5103)
- Zhiyuan Wang (ORCID: https://orcid.org/0000-0001-6642-957X)
- Chenghao Zhang (ORCID: https://orcid.org/0000-0002-6272-0391)
- Fenglian Sun
Institutions
- Harbin University of Science and Technology (CN)
Publication Details
- Journal
- Materials
- Published
- 2025-02-16
- DOI
- https://doi.org/10.3390/ma18040858
- Citations
- 2
- Primary Topic
- Electronic Packaging and Soldering Technologies
- Type
- article
- Field-Weighted Citation Impact
- 1.46
Funders
- Key Research and Development Program of Heilongjiang