5G-TSN Integrated Prototype for Reliable Industrial Communication Using Frame Replication and Elimination for Reliability

The stringent requirements of industrial communication, especially high reliability and real-time response, are regarded as the main bottlenecks for the widespread adoption of wireless technologies in industrial applications. The integration of 5G and Time-Sensitive Networking (TSN) protocols offers convergence of both wireless and various wired communication technologies for industrial applications. In this article, we describe our 5G and TSN integrated prototype, which achieves high reliability based on the IEEE 802.1CB Frame Replication and Elimination for Reliability (FRER) scheme. Different 5G systems have been used in various combinations to empirically study the benefits of FRER for 5G communication in real industrial environments. We evaluate the performance of our prototype and validate it for an industrial use case on Smart Sensors for Milling Processes, requiring a latency below 10 ms for 99.99% of the packets sent, which has been achieved in the measurements using FRER. This use case and the high requirements towards latency and reliability demonstrate the benefits of 5G integration with FRER for industrial production.

Authors

Institutions

Publication Details

Journal
Electronics
Published
2025-02-15
DOI
https://doi.org/10.3390/electronics14040758
Citations
6
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
13.62

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

5G-TSN Integrated Prototype for Reliable Industrial Communication Using Frame Replication and Elimination for Reliability

Praveen Mohanram, Chi‐Chuan Liu, Pierre Kehl, Robert Schmitt et al.
6 citations
Electronics
VLSI and Analog Circuit Testing
13.62
article

5G-TSN Integrated Prototype for Reliable Industrial Communication Using Frame Replication and Elimination for Reliability

Praveen Mohanram, Chi‐Chuan Liu, Pierre Kehl, Robert Schmitt, Junaid Ansari, J.-Y. Yeh, Mikael Lovrin
article en
6 citations

Abstract

The stringent requirements of industrial communication, especially high reliability and real-time response, are regarded as the main bottlenecks for the widespread adoption of wireless technologies in industrial applications. The integration of 5G and Time-Sensitive Networking (TSN) protocols offers convergence of both wireless and various wired communication technologies for industrial applications. In this article, we describe our 5G and TSN integrated prototype, which achieves high reliability based on the IEEE 802.1CB Frame Replication and Elimination for Reliability (FRER) scheme. Different 5G systems have been used in various combinations to empirically study the benefits of FRER for 5G communication in real industrial environments. We evaluate the performance of our prototype and validate it for an industrial use case on Smart Sensors for Milling Processes, requiring a latency below 10 ms for 99.99% of the packets sent, which has been achieved in the measurements using FRER. This use case and the high requirements towards latency and reliability demonstrate the benefits of 5G integration with FRER for industrial production.

ElectronicsVol. 14(4)
Fraunhofer Institute for Production Technology IPT (DE), Ericsson (Germany) (DE), RWTH Aachen University (DE)
HORIZON EUROPE Framework Programme
Openalex Percentile: Top 1%
VLSI and Analog Circuit Testing
13.62
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

5G-TSN Integrated Prototype for Reliable Industrial Communication Using Frame Replication and Elimination for Reliability — Praveen Mohanram, Chi‐Chuan Liu, et al. · Electronics (2025) | TGRS Research Map | TGRS