Electron impact partial ionization cross section and thermal rate coefficients of gaseous refrigerants
Abstract We have calculated the electron impact partial and total ionization cross sections of important gaseous targets which are used in gas-based detectors at high-energy physics experiments. The present work uses the Binary encounter Bethe model and its variants along with the mass spectrometry data for the calculation of cross sections. Trifluoromethane (CHF 3 ), 1,1,1-Trifluoroethane <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mo stretchy="false">(</mml:mo> <mml:mrow> <mml:msub> <mml:mi mathvariant="normal">C</mml:mi> <mml:mn>2</mml:mn> </mml:msub> <mml:msub> <mml:mi mathvariant="normal">H</mml:mi> <mml:mn>3</mml:mn> </mml:msub> <mml:msub> <mml:mi mathvariant="normal">F</mml:mi> <mml:mn>3</mml:mn> </mml:msub> </mml:mrow> <mml:mo stretchy="false">)</mml:mo> </mml:mrow> </mml:math> or R143a, 1,1,1-Trifluoropropane <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mo stretchy="false">(</mml:mo> <mml:mrow> <mml:msub> <mml:mi mathvariant="normal">C</mml:mi> <mml:mn>3</mml:mn> </mml:msub> <mml:msub> <mml:mi mathvariant="normal">H</mml:mi> <mml:mn>5</mml:mn> </mml:msub> <mml:msub> <mml:mi mathvariant="normal">F</mml:mi> <mml:mn>3</mml:mn> </mml:msub> </mml:mrow> <mml:mo stretchy="false">)</mml:mo> </mml:mrow> </mml:math> or R263fb, 3,3,3-Trifluoropropene <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mo stretchy="false">(</mml:mo> <mml:mrow> <mml:msub> <mml:mi mathvariant="normal">C</mml:mi> <mml:mn>3</mml:mn> </mml:msub> <mml:msub> <mml:mi mathvariant="normal">H</mml:mi> <mml:mn>3</mml:mn> </mml:msub> <mml:msub> <mml:mi mathvariant="normal">F</mml:mi> <mml:mn>3</mml:mn> </mml:msub> </mml:mrow> <mml:mo stretchy="false">)</mml:mo> </mml:mrow> </mml:math> or R1243zf, and 1,1,1,2-Tetrafluoroethane <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mo stretchy="false">(</mml:mo> <mml:mrow> <mml:msub> <mml:mi mathvariant="normal">C</mml:mi> <mml:mn>2</mml:mn> </mml:msub> <mml:msub> <mml:mi mathvariant="normal">H</mml:mi> <mml:mn>2</mml:mn> </mml:msub> <mml:msub> <mml:mi mathvariant="normal">F</mml:mi> <mml:mn>4</mml:mn> </mml:msub> </mml:mrow> <mml:mo stretchy="false">)</mml:mo> </mml:mrow> </mml:math> or R134a are studied for the total and partial ionization cross sections along with the corresponding rate coefficients. The rate coefficients are calculated using Maxwell’s velocity distribution function. The rates for the ionization cross sections are fitted with the Arrhenius function, and the fit parameters are also presented. The cross section and the rates are compared with the available data for CHF 3 and a good comparison is found.
Authors
- Dhanoj Gupta (ORCID: https://orcid.org/0000-0001-6717-8194)
- Suriyaprasanth Shanmugasundaram (ORCID: https://orcid.org/0000-0002-3939-1446)
Institutions
- Vellore Institute of Technology University (IN)
Publication Details
- Journal
- Plasma Sources Science and Technology
- Published
- 2025-02-01
- DOI
- https://doi.org/10.1088/1361-6595/adb649
- Citations
- 2
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 1.46
Funders
- Science and Engineering Research Board