Silicon Materials Mid-Infrared Direct Spectral Emissivity Measurement at Intermediate Temperatures
Authors
- Frédéric Marty (ORCID: https://orcid.org/0000-0002-9881-2036)
- Elyes Nefzaoui (ORCID: https://orcid.org/0000-0002-7544-0188)
- Tarik Bourouina (ORCID: https://orcid.org/0000-0003-2342-7149)
- Georges Hamaoui (ORCID: https://orcid.org/0000-0001-8451-3986)
- Lionel Rousseau (ORCID: https://orcid.org/0000-0003-3074-1865)
- Armande Hervé (ORCID: https://orcid.org/0000-0002-6318-878X)
- Elias Akiki (ORCID: https://orcid.org/0000-0002-5100-3266)
- Philippe Basset
Institutions
- Laboratoire d'électronique, systèmes de communication et microsystèmes (FR)
Publication Details
- Journal
- SPIRE - Sciences Po Institutional REpository
- Published
- 2024-10-01
- Primary Topic
- Calibration and Measurement Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00