From Ground to Orbit: A Robust and Efficient Test Methodology for RISC-V Soft-Cores

As traditional space-grade computing systems struggle to meet the increasing computational demands of modern space missions, RISC-V emerges as a promising alternative due to its open-source and highly customizable nature. However, the extensive hardware customization options in RISC-V introduce complexity in validation, making it challenging to ensure system reliability. This paper introduces a robust methodology for validating RISC-V-based systems under accelerated radiation beams, focusing on test uptime, leveraging Commercial Off-The-Shelf (COTS) FPGA devices, which offer flexibility and cost-effectiveness, to enable concurrent hardware and software development. We demonstrate how our methodology offers a comprehensive approach for testing heterogeneous systems on FPGAs, balancing thorough integration with cost-efficiency and test robustness. During our experiments with accelerated neutrons to assess the resilience of RISC-V cores, our approach guaranteed the correct delivery of 100% of the packages, while minimizing system downtime during radiation testing by reducing the Test Fixture SEFI cross-section.

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Publication Details

Journal
IEEE Transactions on Device and Materials Reliability
Published
2025-02-13
DOI
https://doi.org/10.1109/tdmr.2025.3537718
Citations
2
Primary Topic
Fault Detection and Control Systems
Type
article
Field-Weighted Citation Impact
2.43

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From Ground to Orbit: A Robust and Efficient Test Methodology for RISC-V Soft-Cores

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article

From Ground to Orbit: A Robust and Efficient Test Methodology for RISC-V Soft-Cores

Gianluca Furano, Nikolaos Alachiotis, Carlo Cazzaniga, Bruno Forlin, Marco Ottavi, Paolo Rech, Kevin Böhmer
article en
2 citations

Abstract

As traditional space-grade computing systems struggle to meet the increasing computational demands of modern space missions, RISC-V emerges as a promising alternative due to its open-source and highly customizable nature. However, the extensive hardware customization options in RISC-V introduce complexity in validation, making it challenging to ensure system reliability. This paper introduces a robust methodology for validating RISC-V-based systems under accelerated radiation beams, focusing on test uptime, leveraging Commercial Off-The-Shelf (COTS) FPGA devices, which offer flexibility and cost-effectiveness, to enable concurrent hardware and software development. We demonstrate how our methodology offers a comprehensive approach for testing heterogeneous systems on FPGAs, balancing thorough integration with cost-efficiency and test robustness. During our experiments with accelerated neutrons to assess the resilience of RISC-V cores, our approach guaranteed the correct delivery of 100% of the packages, while minimizing system downtime during radiation testing by reducing the Test Fixture SEFI cross-section.

IEEE Transactions on Device and Materials ReliabilityVol. 25(1)
Rutherford Appleton Laboratory (GB), University of Trento (IT), European Space Agency (FR), European Space Research and Technology Centre (NL), University of Twente (NL)
Key Digital Technologies Joint Undertaking, European Commission
Openalex Percentile: Top 13%
Fault Detection and Control Systems
2.43
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