Microwave performance test technology of digital encoding functional material regulatory elements
Digital encoding functional materials make it possible to realize artificial regulation of electromagnetic waves through the arrangement of specific artificial structural units, among which the characteristics of regulatory elements in the microwave frequency band are particularly critical for the design and application of the above materials. This paper designs a microwave performance test system of digital coding functional material regulatory elements working at 8–18 GHz based on the microwave resonance method, and the test algorithm and corresponding test software are written to simplify the test system. The experimental results show that the test system meets the test requirements, supports the test of various regulatory elements, and has the characteristics of wide test frequency, good test accuracy, and stable and reliable results.
Authors
- Jiawei Long (ORCID: https://orcid.org/0000-0001-8689-6933)
- Junying Zhang (ORCID: https://orcid.org/0000-0002-1554-0339)
- Yong Gao (ORCID: https://orcid.org/0000-0002-0994-5209)
- Yang Zhou (ORCID: https://orcid.org/0000-0002-4463-6903)
- Wei Wang (ORCID: https://orcid.org/0000-0002-0503-2816)
- Yu Zhang (ORCID: https://orcid.org/0000-0002-5848-8892)
- Nan Chen (ORCID: https://orcid.org/0000-0002-0161-9433)
- Yongjie Liu (ORCID: https://orcid.org/0000-0003-2148-6313)
- Wenxu Zhong
- Tian Ping
- Run Miao
Institutions
- University of Electronic Science and Technology of China (CN)
- Chengdu University of Information Technology (CN)
- Shanghai Power Equipment Research Institute (CN)
- National Engineering Research Center of Electromagnetic Radiation Control Materials (CN)
Publication Details
- Journal
- Journal of Electromagnetic Waves and Applications
- Published
- 2025-02-12
- DOI
- https://doi.org/10.1080/09205071.2025.2458579
- Primary Topic
- Metamaterials and Metasurfaces Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- National Key Laboratory of Electronic Thin Films and Integrated Devices