Measurement Equipment Inspection Path Planning and Optimization Based on Quantum Annealing Algorithm

In order to address inefficiencies in the inspection path planning of metering equipment and minimize inspection path lengths, this study proposes a novel optimization method based on the quantum annealing algorithm. A mathematical model for metering equipment inspection path planning is developed, accompanied by a new qubit measurement and state update mechanism designed to enhance algorithm convergence speed. Simulation experiments validate the effectiveness of the proposed algorithm, demonstrating its ability to plan inspection paths under diverse conditions while achieving the shortest path lengths and maintaining strong global convergence. The results highlight the algorithm’s potential to significantly improve inspection efficiency and adaptability in real-world scenarios.