Correction techniques for variations and nonlinearity in CMOS terahertz image sensors

Abstract CMOS terahertz detector had a problem with manufacturing variations. In this paper, we proposed a method for simultaneous correction of all pixels that do not interfere with the global shutter operation by mounting a threshold correction mechanism in the pixel circuit. With this correction technique, the σ of the operation points of the pixels was suppressed by 89.4%. We also improved the linearity of the VCO-ADC as the readout circuit, achieving a linearity of +0.43%/−0.37%.