Steady state creep of the silver-tin TLP interconnections of power modules
Purpose This paper aims to investigate the steady-state creep of the multilayer Silver-Tin transient liquid phase (AgSn-TLP) interconnects of the power modules using experiments and constitutive modeling. Design/methodology/approach A series of engineered creep tests is executed at different temperatures and stress levels to produce creep strain versus time data. Accordingly, steady-state creep parameters are acquired through nonlinear regressions. Two steady-state creep relations, including hyperbolic sine and power laws, are created, and validated with measured data. Afterwards, numerical studies are executed to examine the thermomechanical response of the AgSn-TLP interconnects compared to other bond materials. Findings Generally, the AgSn- TLP interconnections showed higher resistance to the accumulation of creep strains, indicating their potential to perform efficiently in high temperature applications. Originality/value This paper models the steady-state creep response of the silver-tin TLP bonds using hyperbolic sine and power laws. These models are important for stress and strain analysis using numerical simulations.
Authors
- Markus Feisst
- Mohammad A. Gharaibeh (ORCID: https://orcid.org/0000-0002-9357-1843)
- Jürgen Wilde (ORCID: https://orcid.org/0000-0002-7762-2583)
Institutions
- Hashemite University (JO)
- University of Freiburg (DE)
Publication Details
- Journal
- Multidiscipline Modeling in Materials and Structures
- Published
- 2025-02-12
- DOI
- https://doi.org/10.1108/mmms-09-2024-0283
- Citations
- 2
- Primary Topic
- Electronic Packaging and Soldering Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.73