Low-frequency noise and DC I–V characterization of gamma-ray irradiation-induced degradation and trap behaviors in a-IGZO TFTs
This work reports the impact of gamma-ray (γ-ray) irradiation-induced degradation based on the trap behaviors in amorphous indium-gallium-zinc-oxide (a-IGZO) thin-film transistors. By employing multiple measurement configurations via low-frequency noise and direct current I–V characterization, we quantitatively investigated the energetic distribution of subgap density-of-states in the a-IGZO channel and the spatial distribution of oxide traps (Not) in the gate insulator, respectively. Also, the qualitative analysis was performed to determine the oxygen-related defects after γ-ray irradiation using x-ray photoelectron spectroscopy. Furthermore, the validity of our results was additionally confirmed by measuring the breakdown voltage and applying positive-bias stress to the fabricated devices exposed to radiation for accelerated tests.
Authors
- Taehwan Moon (ORCID: https://orcid.org/0000-0003-1197-6677)
- Jin‐Ha Hwang (ORCID: https://orcid.org/0000-0002-9581-7413)
- Hagyoul Bae (ORCID: https://orcid.org/0000-0002-2462-4198)
- Keun Heo (ORCID: https://orcid.org/0000-0003-0700-7427)
- Bhishma Pandit (ORCID: https://orcid.org/0000-0001-6863-2002)
- Youn‐Kyoung Lee (ORCID: https://orcid.org/0000-0001-5160-1015)
- Kiyoung Lee (ORCID: https://orcid.org/0000-0003-1716-6886)
- Seongbin Lim
- Soon Joo Yoon
- Binhyeong Lee
- Jae‐Hyoung Yoo (ORCID: https://orcid.org/0009-0000-3334-7180)
- Hyeonjun Song
- Soyeon Kim
- Hongseung Lee
- Sojin Jung
- S H Park (ORCID: https://orcid.org/0009-0001-8224-1072)
- Jo Hak Jeong
- Seohyeon Park
Institutions
- Ajou University (KR)
- Jeonbuk National University (KR)
- Hongik University (KR)
Publication Details
- Journal
- Applied Physics Letters
- Published
- 2025-02-10
- DOI
- https://doi.org/10.1063/5.0238211
- Citations
- 2
- Primary Topic
- Thin-Film Transistor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 1.46
Funders
- National Research Foundation of Korea
- Ministry of Science and ICT, South Korea