Characterization results of the first full-scale readout HYLITE chip for STARLIGHT
Abstract Shanghai HIgh repetition rate XFEL aNd Extreme light facility (SHINE) is a free electron laser facility with a high pulse repetition rate of up to 1 MHz. STARLIGHT (SemiconducTor Array detectoR with Large dynamIc ranGe and cHarge inTegrating readout) is a pixel array detector with a high frame rate (≥ 10 kHz) and a large dynamic range (up to 10 4 photons of 12.4 keV), which is being developed for SHINE. The readout ASIC utilized by STARLIGHT in the front-end module is HYLITE (High dYmamic range free electron Laser Imaging deTEctor). HYLITE200F with 200 μm × 200 μm pixel size and 64 × 64 pixels is the first full-scale chip of the HYLITE series. To facilitate the improvement of the detector, the performances of the single chip and a detector prototype module with 2 × 2 ASICs are carefully evaluated, especially in terms of gain, noise, and dynamic range. The test results show that the gains of the HYLITE200F chip are uniform with a single-photon resolution. Meanwhile, the chip maintains a good linearity at 10 4 photons of 12 keV. After bump-bonding with the sensor, the performance of HYLITE200F still fulfills the requirements.
Authors
- Z. Liu
- X. Ju (ORCID: https://orcid.org/0000-0001-8802-5533)
- Gang Xu (ORCID: https://orcid.org/0000-0002-3721-9597)
- Xiantao Jiang (ORCID: https://orcid.org/0000-0003-1180-4904)
- Z. M. Sheng (ORCID: https://orcid.org/0000-0002-8823-9993)
- Jie Zhang (ORCID: https://orcid.org/0000-0002-6979-7084)
- Tao Sun (ORCID: https://orcid.org/0000-0003-0671-2570)
- M. Li (ORCID: https://orcid.org/0000-0002-0738-4882)
- Peng Sun (ORCID: https://orcid.org/0000-0001-6221-8142)
- Wei Wei (ORCID: https://orcid.org/0000-0002-8391-3811)
- Hang Yin (ORCID: https://orcid.org/0000-0002-5479-7698)
- Zhiwei Li (ORCID: https://orcid.org/0000-0001-8932-5634)
- Xuemin Jia (ORCID: https://orcid.org/0009-0006-8743-9535)
- P. Liu
Institutions
- Chinese Academy of Sciences (CN)
- ShanghaiTech University (CN)
- Institute of Microelectronics (SG)
- Institute of Microelectronics (CN)
- Institute of High Energy Physics (AT)
- Institute of High Energy Physics (CN)
- Shanghai Institute of Microsystem and Information Technology (CN)
- University of Chinese Academy of Sciences (CN)
Publication Details
- Journal
- Journal of Instrumentation
- Published
- 2025-02-01
- DOI
- https://doi.org/10.1088/1748-0221/20/02/c02019
- Primary Topic
- Advanced Semiconductor Detectors and Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- Chinese Academy of Sciences
- Youth Innovation Promotion Association of the Chinese Academy of Sciences
- State Key Laboratory of Particle Detection and Electronics
- Youth Innovation Promotion Association