An Offset Compensated Charge Transfer Pre-Sensing Bitline Sense Amplifier
A bitline sense amplifier (BLSA) with offset compensated charge transfer pre-sensing (OC-CTPS) scheme is implemented using 14-nm dynamic random access memory (DRAM) process. The offset compensation (OC) is operated by diode connection without additional size overhead for BLSA. The average fail bit count (FBC) attributed to a mismatch of charge transfer (CT) transistor was reduced by 94% after performing OC. Furthermore, the proposed OC-CTPS BLSA accomplished 250 and 500 ps of CT time (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$t_{\mathrm {CT}}$ </tex-math></inline-formula>) window, representing the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$t_{\mathrm {CT}}$ </tex-math></inline-formula> region where the FBC is lower than the standard FBC, at the temperatures of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$- 25~^{\circ }$ </tex-math></inline-formula>C and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$100~^{\circ }$ </tex-math></inline-formula>C, respectively, without modifying any operations for CT. Moreover, our approach ensures robust and stable sensing even at operating voltages as low as 0.75 V, compared to conventional latch-based OC BLSA.
Authors
- SangYun Kim (ORCID: https://orcid.org/0000-0002-9101-5704)
- Jeong-Don Ihm
- Kyuchang Kang (ORCID: https://orcid.org/0000-0001-7663-9490)
- Sangjoon Hwang
- Donggeon Kim (ORCID: https://orcid.org/0000-0003-3430-075X)
- Hyunchul Yoon (ORCID: https://orcid.org/0000-0002-2564-7041)
- Young-Hun Seo (ORCID: https://orcid.org/0000-0003-3079-0843)
- Changsik Yoo (ORCID: https://orcid.org/0000-0001-7945-5400)
- Jae‐Hyuk Kim (ORCID: https://orcid.org/0000-0002-3215-2178)
- Chang‐Young Lee (ORCID: https://orcid.org/0000-0001-9429-7949)
- Dongil Lee (ORCID: https://orcid.org/0000-0002-2004-2123)
- Jae-Joon Song
- Incheol Nam
- Bok-Yeon Won
- Kyeongtae Nam
Institutions
- Samsung (South Korea) (KR)
Publication Details
- Journal
- IEEE Journal of Solid-State Circuits
- Published
- 2025-02-10
- DOI
- https://doi.org/10.1109/jssc.2025.3531904
- Citations
- 2
- Primary Topic
- Sensor Technology and Measurement Systems
- Type
- article
- Field-Weighted Citation Impact
- 2.97