Electron sticking coefficients of dusty plasma relevant materials

Using a relative measurement approach, the sticking coefficients of dielectric materials commonly used in “dust in plasma” studies—specifically silica (SiO2), melamine formaldehyde (MF, [C4H8N6O]n), and polymethyl methacrylate (PMMA, [C5O2H8]n)—were estimated. These results offer important insights for interpreting experiments involving various materials or their combinations, enabling more precise comparisons and experimental designs.