Precision tests of third-generation four-quark operators: one- and two-loop matching
A bstract We calculate the one- and two-loop matching corrections in the Standard Model effective field theory (SMEFT) that impact electroweak precision measurements and flavour physics observables, focusing on the contributions of third-generation four-quark operators. Our results provide a crucial ingredient for a model-independent analysis of constraints on beyond the Standard Model physics that primarily affects the sector of third-generation four-quark operators. Concise analytic expressions are provided for all considered precision observables, which should facilitate their inclusion into global SMEFT analyses.
Authors
- Luc Schnell (ORCID: https://orcid.org/0000-0003-2073-9817)
- Ulrich Haisch
Institutions
- Max Planck Institute for Physics (DE)
- Technical University of Munich (DE)
Publication Details
- Journal
- Journal of High Energy Physics
- Published
- 2025-02-07
- DOI
- https://doi.org/10.1007/jhep02(2025)038
- Citations
- 12
- Primary Topic
- Particle physics theoretical and experimental studies
- Type
- article
- Field-Weighted Citation Impact
- 22.44
Funders
- International Max Planck Research School for Environmental, Cellular and Molecular Microbiology
- International Max Planck Research School for Advanced Methods in Process and Systems Engineering