Temporal and spatial characteristics of a 13.6 nm EUV light source

Abstract Spatial and temporal characteristics of a table-top scale laser produced plasma formed on the surface of a tungsten target are reported. The emitted radiation was spectrally filtered to a narrow band of ca. 1 nm full width half maximum (FWHM) centred on a wavelength of 13.6 nm using a combination of Zr thin film transmission filters and a Mo–Si multilayer mirror (MLM). The temporal profile of the 13.6 nm flux was measured for different laser fluences while the spatial profile of the emission was sampled in one region using a back illuminated charge coupled device (CCD), both done with the aid of a flat MLM. The emitting plasma was imaged at 13.6 nm by replacing the flat MLM with a curved mirror which returned an extreme ultraviolet (EUV) source size of up to ca. 130 µms. The peak flux was estimated to be ca . 10 14 photons nm −1 sr −1 . For comparison purposes the W target was replaced by a solid Sn target which produced, on average, almost double the EUV flux at 13.6 nm, albeit with greater shot to shot jitter.

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Publication Details

Journal
Measurement Science and Technology
Published
2025-02-06
DOI
https://doi.org/10.1088/1361-6501/adb323
Primary Topic
Advanced Optical Sensing Technologies
Type
article
Field-Weighted Citation Impact
0.00

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article

Temporal and spatial characteristics of a 13.6 nm EUV light source

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Measurement Science and Technology
Advanced Optical Sensing Technologies
article

Temporal and spatial characteristics of a 13.6 nm EUV light source

James B. Campbell, John Costello, Mary T. Pryce, G. Murray, Stephen M. Durkan, Lazaros Varvarezos, Ross McGarry, Seamus Cummins, Matthew T. Shaw, A. Butler
article en

Abstract

Abstract Spatial and temporal characteristics of a table-top scale laser produced plasma formed on the surface of a tungsten target are reported. The emitted radiation was spectrally filtered to a narrow band of ca. 1 nm full width half maximum (FWHM) centred on a wavelength of 13.6 nm using a combination of Zr thin film transmission filters and a Mo–Si multilayer mirror (MLM). The temporal profile of the 13.6 nm flux was measured for different laser fluences while the spatial profile of the emission was sampled in one region using a back illuminated charge coupled device (CCD), both done with the aid of a flat MLM. The emitting plasma was imaged at 13.6 nm by replacing the flat MLM with a curved mirror which returned an extreme ultraviolet (EUV) source size of up to ca. 130 µms. The peak flux was estimated to be ca . 10 14 photons nm −1 sr −1 . For comparison purposes the W target was replaced by a solid Sn target which produced, on average, almost double the EUV flux at 13.6 nm, albeit with greater shot to shot jitter.

Measurement Science and TechnologyVol. 36(3)
Intel (Ireland) (IE), University of Ioannina (GR), Dublin City University (IE)
Science Foundation Ireland, Sustainable Energy Authority of Ireland
Openalex Percentile: Top 98%
Advanced Optical Sensing Technologies
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