An impermeable copper surface monolayer with high-temperature oxidation resistance
Despite numerous efforts involving surface coating, doping, and alloying, maintaining surface stability of metal at high temperatures without compromising intrinsic properties has remained challenging. Here, we present a pragmatic method to address the accelerated oxidation of Cu, Ni, and Fe at temperatures exceeding 200 °C. Inspired by the concept that oxygen (O) itself can effectively obstruct the pathway of O infiltration, this study proposes the immobilization of O on the metal surface. Through extensive calculations considering various elements (C, Al, Si, Ge, Ga, In, and Sn) to anchor O on Cu surfaces, Si emerges as the optimal element. The theoretical findings are validated through systematic sputtering deposition experiments. The introduction of anchoring elements to reinforce Cu-O bonds enables the formation of an atomically thin barrier on the Cu surface, rendering it impermeable to O even at high temperatures (400 °C) while preserving its intrinsic conductivity. This oxidation resistance, facilitated by the impermeable atomic monolayer, opens promising opportunities for researchers and industries to overcome limitations associated with the use of oxidizable metal films.
Authors
- Su Jae Kim (ORCID: https://orcid.org/0000-0002-6033-8551)
- Sang‐Hyeok Yang (ORCID: https://orcid.org/0000-0002-6287-7612)
- Min‐Hyoung Jung (ORCID: https://orcid.org/0000-0001-5227-8571)
- Jae Hyuck Jang (ORCID: https://orcid.org/0000-0002-9133-3286)
- Seon Je Kim
- Maeng‐Je Seong (ORCID: https://orcid.org/0000-0002-5167-5919)
- Miaofang Chi (ORCID: https://orcid.org/0000-0003-0764-1567)
- Yousil Lee
- Bipin Lamichhane (ORCID: https://orcid.org/0000-0002-9503-083X)
- Se‐Young Jeong (ORCID: https://orcid.org/0000-0003-1019-4403)
- Hak Soo Choi (ORCID: https://orcid.org/0000-0002-7982-6483)
- Binod Regmi
- Hu Young Jeong (ORCID: https://orcid.org/0000-0002-5550-5298)
- Young‐Hoon Kim (ORCID: https://orcid.org/0000-0001-7343-1512)
- Young‐Min Kim (ORCID: https://orcid.org/0000-0003-3220-9004)
- Seong‐Gon Kim (ORCID: https://orcid.org/0000-0002-1629-0319)
Institutions
- Oak Ridge National Laboratory (US)
- Harvard University (US)
- Korea Advanced Institute of Science and Technology (KR)
- Gordon Center for Medical Imaging (US)
- Massachusetts General Hospital (US)
- Institute for Basic Science (KR)
- Korea Basic Science Institute (KR)
- Ulsan National Institute of Science and Technology (KR)
- Pusan National University (KR)
- Chung-Ang University (KR)
- Sungkyunkwan University (KR)
- Mississippi State University (US)
Publication Details
- Journal
- Nature Communications
- Published
- 2025-02-07
- DOI
- https://doi.org/10.1038/s41467-025-56709-w
- Citations
- 4
- Primary Topic
- Graphene research and applications
- Type
- article
- Field-Weighted Citation Impact
- 2.07
Funders
- U.S. Department of Energy
- Mississippi State University
- National Research Foundation
- National Research Foundation of Korea
- Institute for Basic Science
- Samsung
- Office of Science
- Basic Energy Sciences
- Division of Materials Sciences and Engineering