Temperature Performance Evaluation Method for Domestic HgCdTe Mid-Infrared Detectors
Under the current environment of promoting localization, it is of great significance to study the temperature performance of domestic mid-infrared detectors for their development and performance optimization . A test method for the temperature performance of domestic HgCdTe mid-infrared detectors was proposed, and the performance of domestic detectors under different temperature conditions was investigated by quantitatively comparing them with imported high-performance detectors in terms of the temperature characteristics of dark current and response rate. The basic working principle of the mid-infrared detector was introduced, the mechanism of dark current and response rate variation with temperature was analyzed, and the principle and parameter settings of the blackbody radiation light source used in the experiment were explained. In the experimental part, the optical path system was constructed, domestic detector samples and imported detectors were selected for temperature experiments. The experimental data were analyzed and fitted to reveal the differences in dark current and response rate temperature characteristics between the domestic and imported detectors. The experimental results showed that the domestic detector samples had larger dark current and lower response rate compared with the imported detectors, and the temperature sensitivity performance was significantly worse. The results of this study provide a method for the performance testing of domestic detectors, and provide an important reference for the selection of detectors.
Authors
- Jing Geng (ORCID: https://orcid.org/0000-0003-1775-3490)
- Fengfu Tan
- Jie Yu (ORCID: https://orcid.org/0000-0003-0077-9301)
- Zhigang Huang (ORCID: https://orcid.org/0000-0002-8412-235X)
Institutions
- University of Science and Technology of China (CN)
- Chinese Academy of Sciences (CN)
- Anhui Institute of Optics and Fine Mechanics (CN)
Publication Details
- Published
- 2024-11-29
- DOI
- https://doi.org/10.1109/icmsp64464.2024.10867019
- Primary Topic
- Advanced Semiconductor Detectors and Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00