General Quality Characteristic Design of Low Field Quantum Resistance Standard

New low field quantum resistance standard solves troublesome issues of traditional quantum resistance standard, and meets the wide demand for high accuracy measurement of precision resistance in China, marks the development trend of quantum resistance. The new low field quantum resistance standard perfectly combines functional performance index and general quality characteristic index. General quality characteristic work implements the whole process of the product design, ensures the overall quality at the stage of product development and lays the foundation for subsequent production and commercialization.

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Publication Details

Published
2024-11-29
DOI
https://doi.org/10.1109/icmsp64464.2024.10866440
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
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General Quality Characteristic Design of Low Field Quantum Resistance Standard

Qian Zhao, Yujun Xu, Zhen Jiang, Yinghui Guo et al.
Integrated Circuits and Semiconductor Failure Analysis
article

General Quality Characteristic Design of Low Field Quantum Resistance Standard

Qian Zhao, Yujun Xu, Zhen Jiang, Yinghui Guo, Kun Cao, Jiangqi Zhu
article en

Abstract

New low field quantum resistance standard solves troublesome issues of traditional quantum resistance standard, and meets the wide demand for high accuracy measurement of precision resistance in China, marks the development trend of quantum resistance. The new low field quantum resistance standard perfectly combines functional performance index and general quality characteristic index. General quality characteristic work implements the whole process of the product design, ensures the overall quality at the stage of product development and lays the foundation for subsequent production and commercialization.

Affordable and clean energy
Openalex Percentile: Top 75%
Integrated Circuits and Semiconductor Failure Analysis
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