Implementing and Verifying the SPI Communication Protocol in ASICs with Cadence EDA Tools

The increasing complexity of electronic systems demands advanced design and verification techniques, particularly for protocols like the Serial Peripheral Interface (SPI). SPI, initially developed by Motorola, is a widely used synchronous serial communication protocol essential for connecting microcontrollers with peripheral devices. As device interconnectivity grows, ensuring fault-free operation is crucial, necessitating efficient self-test mechanisms to reduce maintenance and testing costs. This paper presents the ASIC design and verification of an 8-bit SPI module, incorporating Built-In-Self-Test (BIST) to enhance fault detection and reliability. Using Cadence EDA tools, the design flow from Register Transfer Level (RTL) coding to gate-level netlist generation is detailed. The verification process includes simulation and formal methods, followed by synthesis, with a focus on timing, power analysis, and optimization challenges.

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Publication Details

Published
2024-10-25
DOI
https://doi.org/10.1109/gccit63234.2024.10861947
Citations
1
Primary Topic
Radiation Effects in Electronics
Type
article
Field-Weighted Citation Impact
0.21
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article

Implementing and Verifying the SPI Communication Protocol in ASICs with Cadence EDA Tools

K Arunkumar, S J Sushma, Vangala Siva Teja
1 citations
Radiation Effects in Electronics
0.21
article

Implementing and Verifying the SPI Communication Protocol in ASICs with Cadence EDA Tools

K Arunkumar, S J Sushma, Vangala Siva Teja
article en
1 citations

Abstract

The increasing complexity of electronic systems demands advanced design and verification techniques, particularly for protocols like the Serial Peripheral Interface (SPI). SPI, initially developed by Motorola, is a widely used synchronous serial communication protocol essential for connecting microcontrollers with peripheral devices. As device interconnectivity grows, ensuring fault-free operation is crucial, necessitating efficient self-test mechanisms to reduce maintenance and testing costs. This paper presents the ASIC design and verification of an 8-bit SPI module, incorporating Built-In-Self-Test (BIST) to enhance fault detection and reliability. Using Cadence EDA tools, the design flow from Register Transfer Level (RTL) coding to gate-level netlist generation is detailed. The verification process includes simulation and formal methods, followed by synthesis, with a focus on timing, power analysis, and optimization challenges.

Saveetha University (IN)
Openalex Percentile: Top 44%
Radiation Effects in Electronics
0.21
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