A 3μm Pixel Device for Peak Power Mitigation of Global-Shutter Indirect Time of Flight Image Sensor

This paper presents a $3 \mu \mathrm{~m}$ pinned photodiode(PPD) pixel device for global-shutter indirect time of flight(iToF) sensor. A trapezoidal-shaped PD-layer and a non-uniform doped charge transfer gate channel are proposed to improve the charge transfer speed and efficiency, which adapt with higher threshold voltage of charge transfer transistor(TX) to reduce the leakage. As a result, the amplitude of TX gate voltage can be reduced, avoiding negative voltage. The proposed pixel device has been designed in a $0.15 \mu \mathrm{~m}$ CMOS image sensor(CIS) process. The simulation results show that full-well capacity (FWC) achieves 12233 e -, with the charge transfer time of 3.33 ns. The high/low level gate voltage of TX can be reduced to $2.9 / 0 \mathrm{~V}$, which is helpful to mitigate the peak power of global-shutter iToF sensor.

Authors

Institutions

Publication Details

Published
2024-10-25
DOI
https://doi.org/10.1109/icta64028.2024.10860503
Primary Topic
Advanced Optical Sensing Technologies
Type
article
Field-Weighted Citation Impact
0.00

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

A 3μm Pixel Device for Peak Power Mitigation of Global-Shutter Indirect Time of Flight Image Sensor

Peng Feng, Ruotong Yin, Jian Liu, Runjiang Dou et al.
Advanced Optical Sensing Technologies
article

A 3μm Pixel Device for Peak Power Mitigation of Global-Shutter Indirect Time of Flight Image Sensor

Peng Feng, Ruotong Yin, Jian Liu, Runjiang Dou, Yu Liang, Weizhe Zhang, Zhe Wang, Liyuan Liu, Nanjian Wu
article en

Abstract

This paper presents a $3 \mu \mathrm{~m}$ pinned photodiode(PPD) pixel device for global-shutter indirect time of flight(iToF) sensor. A trapezoidal-shaped PD-layer and a non-uniform doped charge transfer gate channel are proposed to improve the charge transfer speed and efficiency, which adapt with higher threshold voltage of charge transfer transistor(TX) to reduce the leakage. As a result, the amplitude of TX gate voltage can be reduced, avoiding negative voltage. The proposed pixel device has been designed in a $0.15 \mu \mathrm{~m}$ CMOS image sensor(CIS) process. The simulation results show that full-well capacity (FWC) achieves 12233 e -, with the charge transfer time of 3.33 ns. The high/low level gate voltage of TX can be reduced to $2.9 / 0 \mathrm{~V}$, which is helpful to mitigate the peak power of global-shutter iToF sensor.

University of Science and Technology of China (CN), Chinese Academy of Sciences (CN), Institute of Semiconductors (CN)
National Natural Science Foundation of China, Chinese Academy of Sciences, Research and Development
Climate action
Openalex Percentile: Top 79%
Advanced Optical Sensing Technologies
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.