A 22nm Variation-Tolerant Clock Duty-Cycle Controller for Mitigating Aging-Induced Clock Duty-Cycle Distortion with Path Replica
This study proposes a PVTA variation-tolerant adaptive clock duty-cycle controller (DCC) designed to address aging-induced clock duty-cycle distortion (DCD) with clock tree replica and data path replica. The dual-role DCC integrates monitoring and adjustment within a unified framework, offering robust duty-cycle control under variations without specialized calibration. By indirectly monitoring clock and data path replica, this approach overcomes the challenges associated with in-situ monitoring of clock-leaf nodes and provides a reliable foundation to enable DCC. The architecture supports PVTA-calibration-free operation, enabling precise duty-cycle corrections across a frequency range from 250 MHz to 1 GHz. Implemented in a 22 nm PULP CPU, the DCC demonstrates significant improvements in duty-cycle accuracy with an error margin of only 1.1%, while maintaining a rapid response time of 51 cycles at $1 \mathbf{G H z}$.
Authors
- Junyi Qian (ORCID: https://orcid.org/0000-0001-9390-4567)
- Li Cai (ORCID: https://orcid.org/0000-0001-6737-7396)
- Weiwei Shan (ORCID: https://orcid.org/0000-0001-5520-1326)
- Ruidong Li
- Tuo Li (ORCID: https://orcid.org/0000-0003-2291-579X)
- Zhiting Li (ORCID: https://orcid.org/0000-0003-2317-6466)
- Changwei Yan
- Lishuo Deng (ORCID: https://orcid.org/0009-0009-2394-7663)
Institutions
- Cloud Computing Center (CN)
- Southeast University (CN)
Publication Details
- Published
- 2024-10-25
- DOI
- https://doi.org/10.1109/icta64028.2024.10860572
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Fundamental Research Funds for the Central Universities