Device Characteristic-Aware Quantization for eFlash-Based In-Memory Computing SoC
This study presents an eFlash-based in-memory computing (IMC) SoC leveraging device characteristic-aware quantization to enhance accuracy. A non-uniform quantization method, based on the non-linear characteristics of eFlash devices, is proposed to simplify the control of the number of electrons. Additionally, several channel-wise quantization schemes are introduced, considering the characteristics of the array and data distribution. These methods significantly improve image classification accuracy on the CIFAR-10 dataset using a CNN network, achieving enhancements of $\mathbf{2. 2 \%}, \mathbf{4. 2 \%}, \mathbf{5. 6 \%}$, and $\mathbf{1 4. 4} \%$ compared to baseline models.
Authors
- Yen-Yu Chen (ORCID: https://orcid.org/0009-0006-3960-1673)
- Y.T. Feng (ORCID: https://orcid.org/0000-0002-6396-8698)
- Yisheng Lv (ORCID: https://orcid.org/0000-0002-7565-4979)
- Yong Pei (ORCID: https://orcid.org/0000-0003-0585-2045)
- Wang Kang (ORCID: https://orcid.org/0000-0002-3169-6034)
- Minghua Tang (ORCID: https://orcid.org/0000-0002-0369-9166)
- Hanjie Liu
- Guangyao Wang (ORCID: https://orcid.org/0009-0006-4029-6143)
Institutions
- Xiangtan University (CN)
- Beihang University (CN)
Publication Details
- Published
- 2024-10-25
- DOI
- https://doi.org/10.1109/icta64028.2024.10860710
- Citations
- 2
- Primary Topic
- Advanced Memory and Neural Computing
- Type
- article
- Field-Weighted Citation Impact
- 0.42