22 nm Ultra-Low Power MCU with 43.5nW/KB Sleep Retention Power for Automotive Grade-1 Applications

With the increasing demand for edge devices, microcontroller unit (MCU) is widely utilized in Automotive Grade-1 applications with its mature architecture and ultra-low power consumption. The expansion of application scenarios imposes greater demands on operating temperature, standby power consumption and data retention time. This paper decomposes the main sources of MCU power consumption and proposes low-power design methodology, including low-leakage retention Static Random-Access Memory (SRAM) and optimized clock-tree generation scheme. The MCU is implemented using an industrial 22 nm process. Silicon results show that the hierarchical level of clock tree exhibit a 16.7% reduction compared to the standard flow. The overall SRAM leakage current decreases 59% compared with the scheme without such method. Silicon results demonstrate the operating power consumption is less than $485.92 \mu \mathrm{~W}$, and the leakage current is less than 484.8 nA in the sleep mode.

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Published
2024-10-25
DOI
https://doi.org/10.1109/icta64028.2024.10860483
Citations
1
Primary Topic
Low-power high-performance VLSI design
Type
article
Field-Weighted Citation Impact
0.21

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22 nm Ultra-Low Power MCU with 43.5nW/KB Sleep Retention Power for Automotive Grade-1 Applications

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article

22 nm Ultra-Low Power MCU with 43.5nW/KB Sleep Retention Power for Automotive Grade-1 Applications

Xinning Liu, Jun Yang, Longning Qi, Hao Cai, Wen Wang, Bo Liu, Hongjin Zhu, Yibo Liu
article en
1 citations

Abstract

With the increasing demand for edge devices, microcontroller unit (MCU) is widely utilized in Automotive Grade-1 applications with its mature architecture and ultra-low power consumption. The expansion of application scenarios imposes greater demands on operating temperature, standby power consumption and data retention time. This paper decomposes the main sources of MCU power consumption and proposes low-power design methodology, including low-leakage retention Static Random-Access Memory (SRAM) and optimized clock-tree generation scheme. The MCU is implemented using an industrial 22 nm process. Silicon results show that the hierarchical level of clock tree exhibit a 16.7% reduction compared to the standard flow. The overall SRAM leakage current decreases 59% compared with the scheme without such method. Silicon results demonstrate the operating power consumption is less than $485.92 \mu \mathrm{~W}$, and the leakage current is less than 484.8 nA in the sleep mode.

Southeast University (CN)
National Natural Science Foundation of China, Natural Science Foundation of Jiangsu Province
Affordable and clean energy
Openalex Percentile: Top 44%
Low-power high-performance VLSI design
0.21
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