Degradation Performance Analysis and Reliability Quantitative Evaluation Technology of Electronic Equipment

With the increase of use time, electronic equipment will inevitably experience performance degradation, which will affect the user experience and system function. In this paper, based on the knowledge of materials science, statistics, data science and system engineering, a quantitative reliability evaluation technology based on degraded data is established. By analyzing the internal mechanism of performance degradation of electronic equipment, this paper develops a Wiener process model based on degradation trajectory to quantitatively evaluate the reliability of electronic equipment. The model assumes that the equipment performance degradation is a random process, and the model parameters are estimated by means of maximum likelihood estimation. In this paper, the reliability of electronic equipment is comprehensively evaluated by using such indicators as mean time between failures (MTTF), failure rate function and residual life expectation (ERL). Taking a sensor widely used in industrial control field as an example, this paper collects its performance degradation data, estimates model parameters, and calculates MTTF and ERL, which provides scientific basis for equipment maintenance, repair and replacement decision. The results show that the MTTF of the sensor is 8.5 years, and the ERL of the sensor that has been used for 4 years is 4.2 years. This study not only promotes the development of the theory and method of reliability evaluation of electronic equipment, but also provides technical support for manufacturers and users, and promotes the sustainable development of electronic products industry.