Weak Measurement of the Angular Goos-Hänchen Shift from a Monolayer MoS<sub>2</sub> Immersed in a Dielectric Medium
Optical beam shifts in two-dimensional crystals have been measured until now on samples deposited on some substrates. In these cases, the reflected beam is the linear superposition of the atomic crystal and the substrate contribution. By immersion of a monolayer MoS2 in polydimethylsiloxane, a transparent dielectric material, we can measure the light reflected from the two-dimensional material only. In conjunction with a weak measurement amplification scheme, this allows us to observe for the first time the role of the out-of-plane susceptibility on the angular Goos-Hänchen shift from a two-dimensional material.
Authors
- Luca Dell’Anna (ORCID: https://orcid.org/0000-0002-2012-1681)
- Michele Merano (ORCID: https://orcid.org/0000-0001-7970-4200)
- Juan Cen (ORCID: https://orcid.org/0000-0001-8935-5630)
- Vimarsh Awasthi (ORCID: https://orcid.org/0000-0002-3458-2059)
- Leonardo Cobelli (ORCID: https://orcid.org/0009-0002-7192-6428)
- Jinpeng Liu (ORCID: https://orcid.org/0000-0002-8607-5390)
- Yanbo Zhang (ORCID: https://orcid.org/0009-0001-3919-3888)
- Yu He (ORCID: https://orcid.org/0000-0003-4875-0516)
Institutions
- University of Padua (IT)
- Chengdu University of Information Technology (CN)
- Istituto Nazionale di Fisica Nucleare, Galileo Galilei Institute for Theoretical Physics (IT)
Publication Details
- Journal
- ACS Photonics
- Published
- 2025-02-05
- DOI
- https://doi.org/10.1021/acsphotonics.4c02110
- Citations
- 2
- Primary Topic
- Spectroscopy and Quantum Chemical Studies
- Type
- article
- Field-Weighted Citation Impact
- 2.49