Design and Calibration of a Slit Light Source for Infrared Deflectometry

Infrared deflectometry is an efficient and accurate measuring method for curved surfaces fabricated via grinding or finish milling. The emitting properties and geometrical configurations of the infrared light source is a core component governing the measurement performance. In this paper, an infrared slit light source is designed based on the cavity structure of a polyimide heating film. This design ensures good stability and uniformity of the light source whilst effectively reducing background noise. Additionally, the light source can be applied as a calibration board for calibrating infrared cameras. The light source is aligned using a theodolite and cubic prism to control the positional deviations during scanning. Experimental results demonstrate that the proposed slit light source and calibration method can achieve a measurement accuracy of 1 µm RMS, which can meet the needs of rapid measurement in grinding. This approach provides a reliable, cost-effective, and efficient tool for surface quality assessments in optical workshops and has a broad application potential.

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Publication Details

Journal
Sensors
Published
2025-02-05
DOI
https://doi.org/10.3390/s25030944
Primary Topic
Optical measurement and interference techniques
Type
article
Field-Weighted Citation Impact
0.00

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article

Design and Calibration of a Slit Light Source for Infrared Deflectometry

Min Xu, Xiangchao Zhang, Lu Ye, Wei Wang
Sensors
Optical measurement and interference techniques
article

Design and Calibration of a Slit Light Source for Infrared Deflectometry

Min Xu, Xiangchao Zhang, Lu Ye, Wei Wang
article en

Abstract

Infrared deflectometry is an efficient and accurate measuring method for curved surfaces fabricated via grinding or finish milling. The emitting properties and geometrical configurations of the infrared light source is a core component governing the measurement performance. In this paper, an infrared slit light source is designed based on the cavity structure of a polyimide heating film. This design ensures good stability and uniformity of the light source whilst effectively reducing background noise. Additionally, the light source can be applied as a calibration board for calibrating infrared cameras. The light source is aligned using a theodolite and cubic prism to control the positional deviations during scanning. Experimental results demonstrate that the proposed slit light source and calibration method can achieve a measurement accuracy of 1 µm RMS, which can meet the needs of rapid measurement in grinding. This approach provides a reliable, cost-effective, and efficient tool for surface quality assessments in optical workshops and has a broad application potential.

SensorsVol. 25(3)
Chinese Academy of Sciences (CN), Fudan University (CN), Shanghai Institute of Technical Physics (CN)
Natural Science Foundation of Shanghai, National Natural Science Foundation of China
Affordable and clean energy
Openalex Percentile: Top 99%
Optical measurement and interference techniques
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Design and Calibration of a Slit Light Source for Infrared Deflectometry — Min Xu, Xiangchao Zhang, et al. · Sensors (2025) | TGRS Research Map | TGRS