Sensing an alternating-current signal beyond the cutoff frequency using a single-electron dynamic random-access memory
Single-electron devices are critical for quantum computing and precision sensing, but are limited by high resistance and slow operation. This study applies a nonequilibrium-thermodynamics approach to a nanoscale dynamic random-access memory (DRAM) device monitoring a small number of electrons, enabling it to detect high-frequency signals up to six orders of magnitude higher than the DRAM's cutoff frequency. These insights could advance high-sensitivity sensors and electronic systems, as well as offer avenues for designing low-consumption, high-frequency sensors.
Authors
- T. Hayashi (ORCID: https://orcid.org/0000-0002-3814-0047)
- Chloé Salhani (ORCID: https://orcid.org/0000-0002-1058-958X)
- Katsuhiko Nishiguchi (ORCID: https://orcid.org/0000-0002-1233-4927)
- Kensaku Chida (ORCID: https://orcid.org/0000-0003-0243-6126)
- Takase Shimizu (ORCID: https://orcid.org/0000-0002-8104-4237)
Institutions
- NTT Basic Research Laboratories (JP)
Publication Details
- Journal
- Physical Review Applied
- Published
- 2025-02-05
- DOI
- https://doi.org/10.1103/physrevapplied.23.l021001
- Citations
- 1
- Primary Topic
- Quantum and electron transport phenomena
- Type
- article
- Field-Weighted Citation Impact
- 1.25