Using XeF2 gas and focused ion beam (XeF2-FIB) imaging to contrast and quantify precipitation in metal

Understanding the type, size, and distribution of precipitates within the microstructure of metals is crucial to elucidating their material properties and evolution. However, many characterisation techniques face challenges in effectively distinguishing precipitates from the surrounding matrix. This study introduces the use of gaseous XeF 2 contrast mapping, combined with advanced micrograph processing, to obtain enhanced statistical insights into precipitates and their evolution within steel, Ni, and Zr alloys. In this research, XeF 2 gas is employed to induce ion-channelling contrasts using a Ga Focused Ion Beam (FIB) on experimental Fe9Cr1Mo steel, 316H steel, P91 steel, nickel-based Alloy 690 and Zr1Nb alloy. The application of this technique reveals precipitates and substructures with greater clarity, allowing the extraction of key statistical data, including precipitate type, size, shape, and distribution. Compared to conventional methods, this approach offers a significant improvement in 2D precipitate characterisation and evaluation. The results suggest that the XeF 2 contrast mapping should be considered a valuable addition to the microscopist toolkit for advanced material analysis. • This study demonstrates the impact of magnification on the time-dependent contrast enhancement achieved by the technique. • This technique surpasses SE, BSE, and FIB in delivering more distinct images of carbide precipitates. • Modifications to the legacy technique allow for low-magnification and high-resolution imaging. • The technique enables the segmentation of microstructural features and facilitates significant precipitate and void analysis.