Reliability tests of the SFP+ transceivers and the TGC readout board for the ATLAS experiment at HL-LHC
Abstract Results are presented for reliability tests of the SFP+ transceivers and the readout board of Thin Gap Chambers (TGC) for the ATLAS experiment at HL-LHC. The radiation tolerance was evaluated for the SFP+ transceivers from Broadcom and FS and the TGC frontend board with gamma ray irradiation up to 𝒪 (100) Gy at the Cobalt-60 facility of Nagoya University. An accelerated aging test was also performed for the SFP+ transceivers with the Kintex-7 evaluation board integrated in the temperature chamber.
Authors
- Akimori Wada (ORCID: https://orcid.org/0000-0002-9515-7443)
- A. Makita
- M. Tomoto (ORCID: https://orcid.org/0000-0002-4603-2070)
- Dai Hashimoto
- Hiroshi Morimoto (ORCID: https://orcid.org/0000-0001-7299-2190)
- Shunsuke Kondo (ORCID: https://orcid.org/0000-0001-9565-117X)
- J. Maeda (ORCID: https://orcid.org/0000-0002-9084-3305)
- Ren Nagasaka
- Yoshifumi Narukawa (ORCID: https://orcid.org/0009-0001-7726-8983)
- Y. Horii
- Y. Okumura
- M. Ishino
- H. Kurashige
- Y. Ohsumi
- R. Maeno
Institutions
- High Energy Accelerator Research Organization (JP)
- Nagoya University (JP)
- Kobe University (JP)
- The University of Tokyo (JP)
Publication Details
- Journal
- Journal of Instrumentation
- Published
- 2025-02-01
- DOI
- https://doi.org/10.1088/1748-0221/20/02/c02001
- Primary Topic
- Particle Detector Development and Performance
- Type
- article
- Field-Weighted Citation Impact
- 0.00