New online beam intensity synchronous monitoring system in scanning transmission X-ray microscopy
The scanning transmission X-ray microscopy (STXM) platform based on synchrotron radiation has achieved nanoscale imaging with chemical sensitivity using spectro-microscopy techniques. However, the quality of STXM imaging is affected by the stability of the beam intensity. The top-up operation mode of synchrotrons to maintain a constant electron beam intensity introduces periodic fluctuations in the X-ray beam intensity, leading to notable imaging noise that decreases both contrast and precision. To address this issue, a high-speed real-time beam intensity monitoring system was designed and implemented at the BL08U1A beamline of the Shanghai Synchrotron Radiation Facility. This system utilizes an yttrium-aluminium-garnet crystal along with dual detectors having an acquisition frequency of up to 1 MHz and a synchronization error of less than 20 ns between them. This system can precisely and synchronously monitor the X-ray beam intensity variations which are used to remove noise due to electron injection from STXM images, thereby markedly improving the quality of STXM imaging.
Authors
- Xiangjun Zhen
- Renzhong Tai (ORCID: https://orcid.org/0009-0007-8187-6424)
- Zhi Guo
- Zhen Yao (ORCID: https://orcid.org/0009-0004-5043-2239)
- Xiangzhi Zhang
- Tianxiao Sun (ORCID: https://orcid.org/0000-0002-1987-3915)
- Xuanyu Zhao (ORCID: https://orcid.org/0000-0002-6281-2325)
- Yuchen Jiao
- Shasha Liang
- Zijian Xu (ORCID: https://orcid.org/0000-0002-0006-5301)
- Haigang Liu (ORCID: https://orcid.org/0000-0001-8848-2988)
- Yufei Zhang (ORCID: https://orcid.org/0000-0001-8786-4845)
- Haitao Li (ORCID: https://orcid.org/0000-0001-9160-8334)
- Yong Wang (ORCID: https://orcid.org/0000-0002-7547-2809)
- Bo Zhao (ORCID: https://orcid.org/0000-0002-4391-9426)
- Jian He
Institutions
- Chinese Academy of Sciences (CN)
- ShanghaiTech University (CN)
- Shanghai Advanced Research Institute (CN)
- Shanghai Institute of Applied Physics (CN)
- University of Chinese Academy of Sciences (CN)
- The University of Texas at Austin (US)
Publication Details
- Journal
- Journal of Synchrotron Radiation
- Published
- 2025-02-04
- DOI
- https://doi.org/10.1107/s1600577524012141
- Primary Topic
- Advanced Electron Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- Chinese Academy of Sciences
- Ministry of Science and Technology of the People's Republic of China
- Chinese Academy of Sciences, Shanghai Branch